TESTING PROCEDURE FOR INTEGRATED CIRCUITS (MICROELECTRONICS)
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BTINTEGRATED-, ELECTRONIC CIRCUITS, MICROELECTRONICS, MECHANIC. CONSTRUCTION OF CIRCUITS, PRINTED BOARDS, TESTS (ELECTRICAL ENGINEERING)
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UDC621.3.049.2
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Descriptor GERTESTVERFAHREN FÜR INTEGRIERTE SCHALTUNGEN (MIKROELEKTRONIK)
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Descriptor ENGTESTING PROCEDURE FOR INTEGRATED CIRCUITS (MICROELECTRONICS)
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Descriptor FREPROCÉDURE DE TEST POUR CIRCUITS INTÉGRÉS (MICROÉLECTRONIQUE)
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NTBOUNDARY-SCAN TESTS, BST (MICROELECTRONICS)
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NTMIXED SIGNAL TEST (MICROELECTRONICS)
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NTIDDQ TESTING (MICROELECTRONICS)
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NTONLINE TESTING (MICROELECTRONICS)
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NTSELF-TEST + BUILT-IN-SELF-TEST, BIST (MICROELECTRONICS)
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NTSIGNATURE ANALYSIS, COMPLEX CIRCUITS (MICROELECTRONICS)
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NTSTANDARD TEST INTERFACE LANGUAGE, STIL (MICROELECTRONICS)
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NTTEST PATTERN GENERATIONS (MICROELECTRONICS)