BOUNDARY-SCAN TESTS, BST (MICROELECTRONICS)
  • BT
    TESTING PROCEDURE FOR INTEGRATED CIRCUITS (MICROELECTRONICS)
  • UDC
    621.3.049.2,4
  • Descriptor GER
    BOUNDARY-SCAN TEST, BST (MIKROELEKTRONIK)
  • Descriptor ENG
    BOUNDARY-SCAN TESTS, BST (MICROELECTRONICS)
  • Descriptor FRE
    BOUNDARY-SCAN TEST, BST (MICROÉLECTRONIQUE)
  • Variant GER
    BST, BOUNDARY-SCAN TEST (MIKROELEKTRONIK)
  • Variant GER
    TESTS/BOUNDARY-SCAN TEST, BST (MIKROELEKTRONIK)
  • Variant ENG
    BST, BOUNDARY-SCAN TESTS (MICROELECTRONICS)
  • Variant ENG
    TESTS/BOUNDARY-SCAN TESTS, BST (MICROELECTRONICS)
  • Variant FRE
    TEST/BOUNDARY-SCAN TEST, BST (MICROÉLECTRONIQUE)
  • Variant FRE
    BST/BOUNDARY-SCAN TEST (MICROÉLECTRONIQUE)
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Last data import from Alma: 1 January 2025