SELF-TEST + BUILT-IN-SELF-TEST, BIST (MICROELECTRONICS)
  • BT
    TESTING PROCEDURE FOR INTEGRATED CIRCUITS (MICROELECTRONICS)
  • UDC
    621.3.049.2,3
  • Descriptor GER
    SELBSTTEST, BIST (MIKROELEKTRONIK)
  • Descriptor ENG
    SELF-TEST + BUILT-IN-SELF-TEST, BIST (MICROELECTRONICS)
  • Descriptor FRE
    SELF-TEST + TEST AUTOMATIQUE + AUTOCONTRÔLE, BIST (MICROÉLECTRONIQUE)
  • Variant GER
    INTEGRIERTE SCHALTUNGEN/SELBSTTEST, BIST (MIKROELEKTRONIK)
  • Variant GER
    TESTS/SELBSTTEST, BIST (MIKROELEKTRONIK)
  • Variant ENG
    BIST, BUILT-IN-SELF-TESTS (MICROELECTRONICS)
  • Variant ENG
    BUILT-IN-SELF-TEST, BIST (MICROELECTRONICS)
  • Variant ENG
    TESTS/SELF TEST, BIST (MICROELECTRONICS)
  • Variant ENG
    INTEGRATED CIRCUITS/SELF TEST, BUILT-IN-SELF-TEST, BIST (MICROELECTRONICS)
  • Variant ENG
    TESTS/BUILT-IN-SELF-TESTS, BIST (MICROELECTRONICS)
  • Variant FRE
    TEST/AUTOMATIQUE, BIST (MICROÉLECTRONIQUE)
  • Variant FRE
    AUTOCONTRÔLE, BIST (MICROÉLECTRONIQUE)
  • Variant FRE
    CIRCIUTS INTÉGRÉS/SELF-TEST, BIST (MICROÉLECTRONIQUE)
  • RT
    DEFECT RECOGNITION + FAULT RECOGNITION (ELECTRICAL ENGINEERING)
Contact
·
Last data import from Alma: 1 January 2025