DEFECT RECOGNITION + FAULT RECOGNITION (ELECTRICAL ENGINEERING)
  • BT
    ELECTRICAL AND ELECTRONICS INDUSTRY, MANUFACTURE, LIFETIME, DEFECT RECOGNITION, DEGRADATION (ELECTRICAL ENGINEERING)
  • UDC
    621.3,3.004.64
  • Descriptor GER
    DEFEKTERKENNUNG + FEHLERERKENNUNG (ELEKTROTECHNIK)
  • Descriptor ENG
    DEFECT RECOGNITION + FAULT RECOGNITION (ELECTRICAL ENGINEERING)
  • Descriptor FRE
    DÉPANNAGE + RECHERCHE DE PANNES + DÉPISTAGE DES DÉFAUTS (ÉLECTROTECHNIQUE)
  • Variant GER
    FEHLERERKENNUNG (ELEKTROTECHNIK)
  • Variant GER
    DEFEKTDIAGNOSE (ELEKTROTECHNIK)
  • Variant GER
    FEHLERDIAGNOSE (ELEKTROTECHNIK)
  • Variant GER
    ERKENNUNG/DEFEKTERKENNUNG (ELEKTROTECHNIK)
  • Variant GER
    ERKENNUNG/FEHLERERKENNUNG (ELEKTROTECHNIK)
  • Variant GER
    DIAGNOSE/DEFEKTDIAGNOSE (ELEKTROTECHNIK)
  • Variant GER
    DIAGNOSE/FEHLERDIAGNOSE (ELEKTROTECHNIK)
  • Variant GER
    FEHLERORTUNG (ELEKTROTECHNIK)
  • Variant GER
    FEHLERSUCHEN/ELEKTROTECHNIK
  • Variant GER
    ELEKTROTECHNIK/FEHLERSUCHEN
  • Variant ENG
    ELECTRICAL ENGINEERING/DEFECT RECOGNITION
  • Variant ENG
    FAULT RECOGNITION (ELECTRICAL ENGINEERING)
  • Variant ENG
    DEFECT DIAGNOSIS (ELECTRICAL ENGINEERING)
  • Variant ENG
    FAULT DIAGNOSIS (ELECTRICAL ENGINEERING)
  • Variant ENG
    RECOGNITION/DEFECT RECOGNITION (ELECTRICAL ENGINEERING)
  • Variant ENG
    RECOGNITION/FAULT RECOGNITION (ELECTRICAL ENGINEERING)
  • Variant ENG
    DIAGNOSIS/DEFECT DIAGNOSIS (ELECTRICAL ENGINEERING)
  • Variant ENG
    DIAGNOSIS/FAULT DIAGNOSIS (ELECTRICAL ENGINEERING)
  • Variant ENG
    TROUBLESHOOTING (ELECTRICAL ENGINEERING)
  • Variant ENG
    FAULT FINDING (ELECTRICAL ENGINEERING)
  • Variant ENG
    FAULT LOCATION (ELECTRICAL ENGINEERING)
  • Variant ENG
    FAULT DETECTION (ELECTRICAL ENGINEERING)
  • Variant FRE
    DÉPANNAGE (ÉLECTROTECHNIQUE)
  • Variant FRE
    RECHERCHE/DE PANNES (ÉLECTROTECHNIQUE)
  • Variant FRE
    DÉPISTAGE/DES DEFAUTS (ÉLECTROTECHNIQUE)
  • Variant FRE
    PANNES/RECHERCHE DE PANNES (ÉLECTROTECHNIQUE)
  • Variant FRE
    DIAGNOSTIC/DES DÉFAUTS ET RECHERCHE DE PANNES (ÉLECTROTECHNIQUE)
  • RT
    SELF-TEST + BUILT-IN-SELF-TEST, BIST (MICROELECTRONICS)
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Last data import from Alma: 1 January 2025