ELECTRON MICROSCOPES + ELECTRON MICROSCOPY
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BTELECTRON MICROSCOPES, ELECTRON MICROSCOPY, SCANNING MICROSCOPES, SCANNING MICROSCOPES
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UDC621.385.833.2
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Descriptor GERELEKTRONENMIKROSKOPE + ELEKTRONENMIKROSKOPIE
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Descriptor ENGELECTRON MICROSCOPES + ELECTRON MICROSCOPY
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Descriptor FREMICROSCOPES ÉLECTRONIQUES + MICROSCOPIE ÉLECTRONIQUE
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Variant GERMIKROSKOPE/ELEKTRONENMIKROSKOPE
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Variant GERMIKROSKOPIE/ELEKTRONENMIKROSKOPIE
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Variant GERELEKTRONENMIKROSKOPIE
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Variant ENGELECTRON MICROSCOPY
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Variant ENGMICROSCOPY/ELECTRON MICROSCOPY
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Variant ENGMICROSCOPES/ELECTRON MICROSCOPES
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Variant FREMICROSCOPIE ÉLECTRONIQUE
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NTBALLISTIC ELECTRON EMISSION MICROSCOPES, BEEM
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NTTRANSMISSION ELECTRON MICROSCOPES, TEM + TRANSMISSION ELECTRON MICROSCOPY
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NTFIELD-EMISSION ELECTRON MICROSCOPES + FIELD-EMISSION ELECTRON MICROSCOPY
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NTSCANNING ELECTRON MICROSCOPES, SEM + SCANNING ELECTRON MICROSCOPY
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RTELECTRON MICROSCOPY (PRINCIPLE AND METHODS)
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RTCRYSTAL STRUCTURE ANALYSIS BY ELECTRON BEAMS